Search Constraints

Start Over
Filtering by: Advisor Peterson, Richard B. Remove constraint Advisor: Peterson, Richard B. Date issued sim 1998-04-14 Remove constraint Date issued sim: 1998-04-14

Search Results

  • Thermal characterization technique for thin dielectric films

    Creator:
    Indermuehle, Scott W.
    Abstract:
    A phase sensitive measurement technique that permits the simultaneous determination of two independent thermal properties of thin dielectric films is presented. Applying the technique results in a film's thermal diffusivity and effusivity, from which the thermal conductivity and specific heat can be calculated. The technique involves measuring a specimen's front...
    Resource Type:
    Masters Thesis