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Filtering by: Date issued sim 2009-05-28 Remove constraint Date issued sim: 2009-05-28 Subject Radio frequency integrated circuits -- Testing Remove constraint Subject: Radio frequency integrated circuits -- Testing

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  • Ultra low capacitance RFIC probe

    Creator:
    Jacob, Michael E.
    Abstract:
    In Radio Frequency Integrated Circuits (RFIC) or high frequency digital ICs, there is a demand to probe the internal nodes for testing. The ultra low capacitance RFIC probe presented in his work is a flexible tool for these applications. The probe utilizes the coupling between a tungsten needle and the...
    Resource Type:
    Masters Thesis