A method has been developed to measure the thickness of ZnS thin films on Si using optical interference. Thin film optical interference fringes are dependent upon the thickness of the film, and for this reason the thickness can be determined by measuring reflectance spectrum of a thin film. A grating...
Several topics are presented in this dissertation, each of which has applications to solar cells and photodetectors. First, we discuss the growth of Cu10Te4S13, copper tellurium tetrahedrite. This material has interesting optical properties; it has a large joint density of states at the conduction band maximum and valence band minimum,...
Because of its attractive material properties like high hardness, high toughness, and excellent high temperature strength, materials like silicon nitride are becoming more common for use in high performance applications. However, there have been limited studies of the fatigue behavior of small cracks in silicon nitride and other materials toughened...