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Ultra low capacitance RFIC probe

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dc.contributor.advisor Forbes, Leonard
dc.creator Jacob, Michael E.
dc.date.accessioned 2009-06-17T23:14:31Z
dc.date.available 2009-06-17T23:14:31Z
dc.date.copyright 2009-05-28
dc.date.issued 2009-06-17T23:14:31Z
dc.identifier.uri http://hdl.handle.net/1957/11868
dc.description Graduation date: 2009 en
dc.description.abstract In Radio Frequency Integrated Circuits (RFIC) or high frequency digital ICs, there is a demand to probe the internal nodes for testing. The ultra low capacitance RFIC probe presented in his work is a flexible tool for these applications. The probe utilizes the coupling between a tungsten needle and the inner conductor of a coaxial cable, forming a capacitor. The ultra low capacitance of the probe enables low probe loading on the circuit under test. With capacitive coupling, the probe output is the derivative of the input signal. Through the use of probe calibration and Fourier transforms, the probed signal can be recovered. Probe calibration develops a transfer function enabling recovery of time domain signals. By utilizing a simple mechanical design, input impedance is maximized and parasitic components are minimized. en
dc.language.iso en_US en
dc.subject.lcsh Radio frequency integrated circuits -- Testing en
dc.subject.lcsh Probes (Electronic instruments) -- Design and construction en
dc.title Ultra low capacitance RFIC probe en
dc.type Thesis/Dissertation en
dc.degree.name Master of Science (M.S.) in Electrical and Computer Engineering en
dc.degree.level Master's en
dc.degree.discipline Engineering en
dc.degree.grantor Oregon State University en
dc.contributor.committeemember Brekken, Ted
dc.contributor.committeemember Liu, Huaping
dc.contributor.committeemember Zaworski, Joseph

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