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Vacuum ultraviolet reflectivity measurements of thin-film electroluminescent phosphors

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dc.creator Lite, K.
dc.creator Thuemler, R. L.
dc.creator Plant, T. K.
dc.creator Wager, J. F.
dc.creator Morton, D. C.
dc.creator Sun, S. S.
dc.creator Mauch, R. H.
dc.date.accessioned 2010-02-01T15:09:20Z
dc.date.available 2010-02-01T15:09:20Z
dc.date.issued 1996-12-02
dc.identifier.citation Lite, K., Thuemler, R. L., Plant, T. K., Wager, J. F., Morton, D. C., Sun, S. S., et al. (1996). Vacuum ultraviolet reflectivity measurements of thin-film electroluminescent phosphors [Electronic version]. Applied Physics Letters, 69(23), 3525-3527. en
dc.identifier.uri http://hdl.handle.net/1957/14183
dc.description Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Institute of Physics (http://www.aip.org/).
dc.description.abstract Vacuum ultraviolet reflectivity measurements of three thin-film electroluminescent phosphors, zinc sulfide (ZnS), strontium sulfide (SrS), and strontium-calcium thiogallate (Sr₀.₄₅Ca₀.₅₅Ga₂S₄), are reported using thin-film samples. Measured ZnS reflectivity peak positions are in agreement with values previously reported in the literature. SrS room temperature reflectivity measurements are found to be consistent with previously reported low temperature measurements. Reflectivity measurements of Sr₀.₄₅Ca₀.₅₅Ga₂S₄ are reported for the first time; the reflectivity spectrum is found to rise monotonically above the band gap and to exhibit almost no structure, except for a small shoulder at ~6.8 eV and a single, broad peak at ~8.5 eV. The unusual nature of the Sr₀.₄₅Ca₀.₅₅Ga₂S₄ reflectivity spectrum is attributed to positional disorder in the stoichiometric thiogallate film. en
dc.language.iso en_US en
dc.publisher American Institute of Physics en
dc.relation.ispartofseries Applied Physics Letters en
dc.relation.ispartofseries Vol. 69 No. 23 (1996 DEC) en
dc.title Vacuum ultraviolet reflectivity measurements of thin-film electroluminescent phosphors en
dc.type Article en
dc.identifier.doi 10.1063/1.117233


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