Abstract:
We demonstrate terahertz (THz) imaging and spectroscopy of single-layer graphene deposited on an intrinsic Si substrate using THz time-domain spectroscopy. A single-cycle THz pulse undergoes multiple internal reflections within the Si substrate, and the THz absorption by the graphene layer accumulates through the multiple interactions with the graphene/Si interface. We exploit the large absorption of the multiply reflected THz pulses to acquire high-contrast THz images of graphene. We obtain local sheet conductivity of the graphene layer analyzing the transmission data with thin-film Fresnel formula based on the Drude model.
Description:
This is the author's peer-reviewed final manuscript, as accepted by the publisher. The published article is copyrighted by Springer and can be found at: http://www.springer.com/engineering/electronics/journal/10762.
