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NMR study of heavily doped Si:B

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dc.contributor.advisor Warren, William W. Jr
dc.creator Fuller, Scott E.
dc.date.accessioned 2012-11-15T16:18:49Z
dc.date.available 2012-11-15T16:18:49Z
dc.date.copyright 1994-09-29
dc.date.issued 1994-09-29
dc.identifier.uri http://hdl.handle.net/1957/35074
dc.description Graduation date: 1995 en_US
dc.language.iso en_US en_US
dc.subject.lcsh Nuclear magnetic resonance, Pulsed en_US
dc.subject.lcsh Doped semiconductors en_US
dc.subject.lcsh Spectrometer en_US
dc.title NMR study of heavily doped Si:B en_US
dc.type Thesis/Dissertation en_US
dc.degree.name Doctor of Philosophy (Ph. D.) in Physics en_US
dc.degree.level Doctoral en_US
dc.degree.discipline Science en_US
dc.degree.grantor Oregon State University en_US
dc.description.digitization File scanned at 300 ppi (Monochrome) using ScandAll PRO 1.8.1 on a Fi-6770A in PDF format. CVista PdfCompressor 4.0 was used for pdf compression and textual OCR. en_US
dc.description.peerreview no en_us


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