NMR study of heavily doped Si:B

dc.contributor.advisor	Warren, William W. Jr
dc.creator	Fuller, Scott E.
dc.date.accessioned	2012-11-15T16:18:49Z
dc.date.available	2012-11-15T16:18:49Z
dc.date.copyright	1994-09-29
dc.date.issued	1994-09-29
dc.identifier.uri	http://hdl.handle.net/1957/35074
dc.description	Graduation date: 1995	en_US
dc.language.iso	en_US	en_US
dc.subject.lcsh	Nuclear magnetic resonance, Pulsed	en_US
dc.subject.lcsh	Doped semiconductors	en_US
dc.subject.lcsh	Spectrometer	en_US
dc.title	NMR study of heavily doped Si:B	en_US
dc.type	Thesis/Dissertation	en_US
dc.degree.name	Doctor of Philosophy (Ph. D.) in Physics	en_US
dc.degree.level	Doctoral	en_US
dc.degree.discipline	Science	en_US
dc.degree.grantor	Oregon State University	en_US
dc.description.digitization	File scanned at 300 ppi (Monochrome) using ScandAll PRO 1.8.1 on a Fi-6770A in PDF format. CVista PdfCompressor 4.0 was used for pdf compression and textual OCR.	en_US
dc.description.peerreview	no	en_us