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Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distribution

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dc.contributor.advisor Plant, Thomas K.
dc.creator Streicher, Keone R.
dc.date.accessioned 2012-11-16T18:28:46Z
dc.date.available 2012-11-16T18:28:46Z
dc.date.copyright 1994-07-12
dc.date.issued 1994-07-12
dc.identifier.uri http://hdl.handle.net/1957/35088
dc.description Graduation date: 1995 en_US
dc.description.abstract In this report, the optical characteristics of ZnS:Tb AC driven thin-film electroluminescent devices are evaluated. Luminescence at low and room temperature under a constant phosphor field is recorded in order to probe the hot electron energy distribution. Samples fabricated by atomic layer epitaxy and by sputter deposition are investigated and their differences and similarities evaluated. The ALE sample exhibits a drastic increase in luminescence at low temperature, while the sputtered sample displays a decrease in luminescence at low temperature. The reduction of optical phonon scattering and nonradiative transition rates at low temperature are believed to be responsible for these changes. Differences between ALE and sputtered samples are due to the different fabrication methods. The approach suggested by Krupka in 1972 of determining the hot electron energy distribution by taking the ratio intensities of two luminescent transitions from different upper states in Tb³⁺, is shown to be inaccurate due to the possible nonradiative transitions taking place. The Tb³⁺ impact excitation quantum yield at a wavelength of 489 nm is measured and is shown to agree with Monte Carlo simulations. Saturation occurs due to the increase in band-to-band impact ionization at high phosphor fields. en_US
dc.language.iso en_US en_US
dc.subject.lcsh Electroluminescent devices en_US
dc.subject.lcsh Hot carriers en_US
dc.title Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distribution en_US
dc.type Thesis/Dissertation en_US
dc.degree.name Master of Science (M.S.) in Electrical and Computer Engineering en_US
dc.degree.level Master's en_US
dc.degree.discipline Engineering en_US
dc.degree.grantor Oregon State University en_US
dc.contributor.committeemember Wager, John F.
dc.contributor.committeemember Goodnick, S. M.
dc.contributor.committeemember Koretsky, Milo
dc.description.digitization File scanned at 300 ppi (Monochrome) using ScandAll PRO 1.8.1 on a Fi-6670 in PDF format. CVista PdfCompressor 4.0 was used for pdf compression and textual OCR. en_US
dc.description.peerreview no en_us


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