Index Catalog // ScholarsArchive@OSU

Characterization of BaCuSF Thin Films Grown in Excess Copper, by Pulsed Laser Deposition

Creator:: DeBlander, Evan F.
Abstract:: Thin films of the p-type semiconductor, barium copper sulfide fluoride (BaCuSF) were deposited using pulsed laser deposition. Similar p-type conductivity in Cu2O is caused by copper vacancies. Addition of copper dopant is proposed as a method for filling the copper vacancies in BaCuSF. The films are characterized to determine quality...
Resource Type:: Honors College Thesis

Thermal conductivity measurements of amorphous thin films on silicon via the 3ω method

Creator:: Wiedle, River Alan
Abstract:: Thermal transport properties of a material are often difficult to measure, especially for thin films, but they are important for materials that have applications in modern devices, such as nano-scale electronics, thermoelectrics, and thermally resistive coatings. In this thesis, we describe an apparatus developed to measure the thermal conductivity of...
Resource Type:: Honors College Thesis

Creation of Western Oregon University weather ballooning program: GPS tracking, heating circuitry, and balloon filling procedure

Creator:: Schepige, Justin
Abstract:: The addition of a weather ballooning program at Western Oregon University creates research opportunities for the Science Department, allows for projects in professional development for in-service teachers, fosters a partnership with Oregon Space Grant, and creates another option for students participating in the Program for Undergraduate Research Experiences. As the...
Resource Type:: Honors College Thesis

Determining thickness of zinc sulfide thin films through optical spectroscopy

Creator:: Prudell, Kathleen
Abstract:: A method has been developed to measure the thickness of ZnS thin films on Si using optical interference. Thin film optical interference fringes are dependent upon the thickness of the film, and for this reason the thickness can be determined by measuring reflectance spectrum of a thin film. A grating...
Resource Type:: Undergraduate Thesis

Detecting ZnS Thin Films on Si Substrates using X-Ray Diffraction

Creator:: Howorth, Benjamin
Abstract:: The goal of this research is to determine whether x-ray diffraction (XRD) is a viable method for resolving ZnS thin films on Si substrates. The samples are ZnS thin films of thickness between 50nm and 100nm, on Si substrates that are 0.5mm thick. ZnS and Si have nearly identical lattice...
Resource Type:: Undergraduate Thesis

Thermoelectric Characterization of SiliconWafers and Cu₁₂Sb₄S₁₃ Variant Thin Films

Creator:: Snyder, Rodney Austin
Abstract:: The Van der Pauw method for transport measurements of conductivity and carrier concentration were tested on indium-tin-oxide (ITO) films and silicon wafers, and then implemented on Cu10xAgxZn2Sb4S13 thin films. ITO was used as a test case for high temperature transport measurements because it a well characterized semi-metal. The mobility of...
Resource Type:: Honors College Thesis

Measurement and Modeling of Zinc Sulfide Thin Films using Ellipsometry and Reflection Spectroscopy : A Comparison of Optical Characterization Techniques

Creator:: Kratzer, Aaron and Kratzer, Aaron C.
Abstract:: Zinc sulfide thin films on silicon wafers were analyzed for layer thickness, refractive index, and absorption using reflection spectroscopy (RS), spectroscopic ellipsometry (SE), and modeling programs. RS and refractive index values from literature were used to model film thickness based on reflection and the SCOUT modeling program was used to...
Resource Type:: Undergraduate Thesis

Observation of the third harmonic sinusoidal voltage response of a small incandescent lightbulb

Creator:: Hutchings, Scott
Abstract:: This thesis looks at the third harmonic voltage response of a small incandescent lightbulb. The third harmonic voltage, or 3 omega (3ω) voltage, arises from applying a 1ω sinusoidal voltage across a resistive material. The 3ω voltage carries with it information about the thermal conductivity of the material. A lock-in-amplifier...
Resource Type:: Presentation and Undergraduate Thesis

Temperature Dependence of Cu₃₋xSb₁₋[subscript y]M[subscript y]S₄ (M=Sn,Ge) Resistivity and Thermopower

Creator:: Mutch, Joshua
Abstract:: An experimental apparatus is modified to allow measurements of the Seebeck coefficient and resistivity to be taken simultaneously. This apparatus is designed for bulk and thin film samples between temperatures of 10 K and 300 K. The apparatus is constructed such that these simultaneous measurements do not interfere with each...
Resource Type:: Undergraduate Thesis

Electrical Transport Measurements on the Alloy Sn₁-ₓCaₓSe

Creator:: Stahly, Joshua
Abstract:: Hall measurements can be made on the unstudied alloy, Sn₁-ₓCaₓSe to determine its electrical transport properties. The Sn₁-ₓCaₓSe samples were made by laser deposition into thin films and have a variable of calcium concentration x. These samples are approximately 250 nm in thickness, were grown at 366° C and are...
Resource Type:: Undergraduate Thesis

ScholarsArchive@OSU

Characterization of BaCuSF Thin Films Grown in Excess Copper, by Pulsed Laser Deposition

Thermal conductivity measurements of amorphous thin films on silicon via the 3ω method

Creation of Western Oregon University weather ballooning program: GPS tracking, heating circuitry, and balloon filling procedure

Determining thickness of zinc sulfide thin films through optical spectroscopy

Detecting ZnS Thin Films on Si Substrates using X-Ray Diffraction

Thermoelectric Characterization of SiliconWafers and Cu₁₂Sb₄S₁₃ Variant Thin Films

Measurement and Modeling of Zinc Sulfide Thin Films using Ellipsometry and Reflection Spectroscopy : A Comparison of Optical Characterization Techniques

Observation of the third harmonic sinusoidal voltage response of a small incandescent lightbulb

Temperature Dependence of Cu₃₋xSb₁₋[subscript y]M[subscript y]S₄ (M=Sn,Ge) Resistivity and Thermopower

Electrical Transport Measurements on the Alloy Sn₁-ₓCaₓSe

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