The optical characterization of transparent conductive thin films is demonstrated. The basics of transparency and conductivity, as they relate to transparent conductor research, are explained. A functional model of the reflectance and transmittance of a sample film, including interference fringes, is derived from the Fresnel electric field amplitude coefficients. The...
A method has been developed to measure the thickness of ZnS thin films on Si using optical interference. Thin film optical interference fringes are dependent upon the thickness of the film, and for this reason the thickness can be determined by measuring reflectance spectrum of a thin film. A grating...