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Filtering by: Subject Embedded computer systems -- Testing Remove constraint Subject: Embedded computer systems -- Testing Degree Level Doctoral Remove constraint Degree Level: Doctoral

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  • Leveraging Generated Tests

    Creator:
    Alipour, Mohammad Amin
    Abstract:
    The main goal of automated test generation is to improve the reliability of a program by exposing faults to developers. To this end, testing should cover the largest possible portion of the program given a test budget (i.e., time and resources) as frequently as possible. Coverage of a program entity...
    Resource Type:
    Dissertation
    Full Text:
    testing has little ability (without considerable human effort) to focus on part of a system under test

  • The Architecture of a Reusable Built-In Self-Test for Link Training, IO and Memory Defect Detection and Auto Repair on 14nm Intel SOC

    Creator:
    Querbach, Bruce
    Abstract:
    The complexity of designing and testing today's system on chip (SOC) is increasing due to greater integrated circuit (IC) density and higher IO and memory frequencies. SOCs for the mobile phone and tablet market have the unique challenge of short product development windows, at times less than six months, and...
    Resource Type:
    Dissertation
    Full Text:
    : ______________________________________________________ Patrick Y. Chiang The complexity of designing and testing today’s system on chip