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Filtering by: Resource Type Masters Thesis Remove constraint Resource Type: Masters Thesis Subject Metal oxide semiconductor field-effect transistors Remove constraint Subject: Metal oxide semiconductor field-effect transistors

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Hot electron effects in N-channel MOSFET's

Creator:

Or, Siu-shun Burnette

Abstract:

The purpose of this work is to develop a new model for LDD n-MOSFET degradation in drain current under long-term AC use conditions for lifetime projection which includes a self-limiting effect in the hot-electron induced device degradation. Experimental results on LDD n-channel MOSFETs shows that the maximum drain current degradation...

Resource Type:

Masters Thesis
Reliability and hot-electron effects in analog and mixed-mode circuits

Creator:

Ge, David Ying

Abstract:

Reliability of sub-micron analog circuits is directly related to impact ionization and the subsequent changes in threshold voltage and drain current of n-MOSFET devices. This thesis presents theory of the hot-electron effects on the device characteristics and circuit performance, explores several approaches to improve performance at both the device and...

Resource Type:

Masters Thesis
Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

Creator:

Aminzadeh, Payman G.

Abstract:

Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...

Resource Type:

Masters Thesis
MOSFET-only predictive track and hold circuit

Creator:

Qiu, Xiangping

Abstract:

High-accuracy and high-speed CMOS track-and-hold (T/H) or sample-and-hold (S/H) circuits are an important part of the analog-to-digital interface. The switched-capacitor (SC) circuits usually contain one or more op-amps whose dc offset, finite gain, finite bandwidth have a big impact on the accuracy of the track-and-hold circuit. Basic correlated double sampling...

Resource Type:

Masters Thesis
SPICE models for flicker noise in p-MOSFET's and phase noise effects on oscillator circuits

Creator:

Zhou, Junlin, 1973-

Resource Type:

Masters Thesis
Layout dependent and bias independent scalable substrate model for RF MOSFETs

Creator:

Suravarapu, Ravikanth

Abstract:

The dependence of the substrate resistance, R[subscript sub], for MOS transistor RF modeling on transistor biasing and layout is studied from device simulations and measurements. Though R[subscript sub] is found to be bias dependent, the error incurred by assuming a constant value equal to the DC resistance is not significant....

Resource Type:

Masters Thesis

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Academic Affiliation

Electrical and Computer Engineering6

Advisor

Forbes, Leonard3
Mayaram, Kartikeya1
Temes, Gabor C.1
Wager, John F.1

Commencement Year

Commencement Year range begin – Commencement Year range end

Current results range from 1992 to 2003

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Committee Member

Baker, Gregory1
Coakley, J. A.1
Goodnick, S. M.1
Kiaei, Sayfe1
Liu, Huaping1
more Committee Members »

Creator

Aminzadeh, Payman G.1
Ge, David Ying1
Or, Siu Shun Burnette1
Qiu, Xiangping1
Suravarapu, Ravikanth1
more Creators »

Date

Date range begin – Date range end

Current results range from 1991 to 2003

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Decade

2000-20092
1990-19994

Degree Field

Electrical and Computer Engineering6

Degree Level

Master's6

Degree Name

Master of Science (M.S.)6

Language

English [eng]6

License

All rights reserved1

Non-Academic Affiliation

Oregon State University. Graduate School6

Peer Reviewed

No6

Resource Type

Masters Thesis[remove]6

Rights Statement

Copyright Not Evaluated4
In Copyright2

Subject

Metal oxide semiconductor field-effect transistors[remove]6
Hot carriers3
Differential amplifiers1
Electric noise1
Integrated circuits -- Reliability1
more Subjects »

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