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Filtering by: Advisor Kenney, John G. Remove constraint Advisor: Kenney, John G. Subject Operational amplifiers -- Testing Remove constraint Subject: Operational amplifiers -- Testing

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  • High speed buffers for op-amp characterization

    Creator:
    Rangan, Giri N. K.
    Abstract:
    The feasibility of developing test circuits to perform in-circuit testing of analog circuits is investigated in this thesis. A modular approach to analog testing has been adopted. Accordingly, the testing of an operational amplifier, which is a basic building block in analog circuits, is addressed. One convenient technique for measuring...
    Resource Type:
    Masters Thesis
    Full Text:
    : High Speed Buffers.for Op amp Characterization Abstract approved: ' / John G. ey ,..... The

  • Opamp characterization techniques

    Creator:
    Ramamurthy, Karthik
    Abstract:
    Standard methodologies exist for testing and characterizing digital circuits but the same cannot be said of analog circuits. Though much theoretical work has been done to model the linear and nonlinear aspects of analog circuits, a firm practical background for the design of testable analog cells has yet to be...
    Resource Type:
    Masters Thesis
    Full Text:
    presented on June 22. 1993 Title: Opamp Characterization Techniques Abstract approved : John G. Kenney