Index Catalog // ScholarsArchive@OSU

Current-feedthrough cancellation technique for current-mode T/H circuits

Creator:: Young, David Y. W.
Abstract:: In this paper, an analysis of the clock-feedthrough effects in switched-current (SI)' circuits will be presented. The clock-feedthrough effects caused by the non-ideal characteristic of MOS switches when they are turned off limit the accuracy of the analog track-and-hold (T/H) circuits. A model to analyze and characterize this effect is...
Resource Type:: Masters Thesis
Full Text:: M. Goodnick, Donald L. Amort, and Don Pierce, for taking time out from their hectic schedules to

Growth and characterization of III-V compound semiconductor materials for use in novel MODFET structures and related devices

Creator:: Schulte, Donald W.
Resource Type:: Dissertation
Full Text:: in Novel MODFET Structures and Related Devices. Abstract approved: John R. Arthur Stephen M

A universal CMOS current-mode operational amplifier

Creator:: Botelho, Cindy
Abstract:: It has become customary in electrical engineering to think of signal processing in terms of voltage variables to the exclusion of current variables. This tendency has resulted in voltage signal processing circuits such as voltage-controlled voltage sources (VCVS) and voltage-mode operational amplifiers. However, the VCVS operational amplifier has several limitations...
Resource Type:: Masters Thesis
Full Text:: of my defense council; Professor Steve Goodnick, Professor John Wager, and Professor Joel Davis

Internal charge-phosphor field analysis, electrical characterization, and aging studies of AC thin-film electroluminescent devices

Creator:: Abu-Dayah, Ahmad I.
Resource Type:: Masters Thesis
Full Text:: encouragement. I would like to thank Professors S. M. Goodnick, A. Weisshar, and David Griffiths for serving

High accuracy CMOS switched-current ladder filters

Creator:: Hoei, Jung-sheng
Abstract:: Clock-feedthrough effects, channel-length modulation and device mismatch are the main causes of the inaccuracy of Switched-Current (SI) circuits. In this paper, these non-ideal effects are analyzed. A high-performance current mirror, namely regulated cascode current mirror, which eliminates drain voltage variation problem is introduced. By using this current mirror as a...
Resource Type:: Masters Thesis
Full Text:: to thank my graduate committee members, Drs. Stephen M. Goodnick, Roy Rathja, and Donald Pierce for

MOS switched-current biquadratic filters

Creator:: Lee, Bor
Abstract:: A MOS biquadratic (biquad) filter employing the switched-current technique is reported. The circuit uses current-mode processing which can offer wide bandwidth, low voltage operation, and can be implemented with standard CMOS technology. Examples of lowpass, highpass, and bandpass filters are given which illustrate the synthesis procedures and the versatility of...
Resource Type:: Masters Thesis
Full Text:: committee members, Dr. James H. Herzog, Dr. Stephen M. Goodnick, and Dr. John L. Nabelek for their time

Analytical model of GaAs MESFET output conductance with frequency and temperature dependent parameters

Creator:: Lam, Steven C. F.
Abstract:: The output characteristics of a conventional GaAs depletion-mode MESFET device have been investigated. One of the important parameters of the small-signal GaAs MESFET model, g[subscript ds] (output conductance), is shown to be frequency and temperature dependent. Variations in g[subscript ds] are a serious problem in many analog and digital circuits...
Resource Type:: Masters Thesis
Full Text:: Stephen M. Goodnick, and professor Curtis R. Cook for serving on my graduate committee. I am

Current mode analog and digital circuit design

Creator:: Liang, Guojin
Abstract:: In this dissertation, two important current mode circuit design subjects have been explored. In the first part, the switched-current circuit technique has been investigated. The fundamental performance and limitations of this technique are explored. One of the major limitations, the signal distortion caused by clock feedthrough has been substantially reduced...
Resource Type:: Dissertation
Full Text:: graduate committee members, Prof. Donald Amort, Prof. James Herzog, Prof. Stephen Goodnick, and Prof

Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

Creator:: Aminzadeh, Payman G.
Abstract:: Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...
Resource Type:: Masters Thesis
Full Text:: support during the course of this study. I would like to thank Professors S. M. Goodnick, R. Schreier

Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distribution

Creator:: Streicher, Keone R.
Abstract:: In this report, the optical characteristics of ZnS:Tb AC driven thin-film electroluminescent devices are evaluated. Luminescence at low and room temperature under a constant phosphor field is recorded in order to probe the hot electron energy distribution. Samples fabricated by atomic layer epitaxy and by sputter deposition are investigated and...
Resource Type:: Masters Thesis
Full Text:: discussions, S. M. Goodnick, and Milo Koretsky for serving on my committee. Special thanks to Wie Ming Ang

ScholarsArchive@OSU

Current-feedthrough cancellation technique for current-mode T/H circuits

Growth and characterization of III-V compound semiconductor materials for use in novel MODFET structures and related devices

A universal CMOS current-mode operational amplifier

Internal charge-phosphor field analysis, electrical characterization, and aging studies of AC thin-film electroluminescent devices

High accuracy CMOS switched-current ladder filters

MOS switched-current biquadratic filters

Analytical model of GaAs MESFET output conductance with frequency and temperature dependent parameters

Current mode analog and digital circuit design

Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

Electo-optic characterization of ZnS:Tb ACTFEL devices for probing the hot electron distribution

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