Energy consumption is one of the primary bottlenecks to both large and small scale modern compute platforms. Reducing the operating voltage of digital circuits to voltages where the supply voltage is near or below the threshold of the transistors has recently gained attention as a method to reduce the energy...
The purpose of this study is to develop accuracy enhancement techniques for the Time
Domain Reflection/Transmission (TDR/T) measurements including the analysis of the
error sources for the Enhanced Accuracy TDR/T (EA-TDR/T). These TDR/T techniques
are used for IC and IC package interconnect characterization and equivalent circuit model
extraction, which are...
Concurrent error detection (CED) is the detection of errors or faults in a circuit or data path concurrent with normal operation of that circuit. The general approach for CED is to calculate a check symbol for the inputs to the circuit under operation, predict the check symbol that will result...
Reliability of sub-micron analog circuits is directly related to impact ionization and
the subsequent changes in threshold voltage and drain current of n-MOSFET devices.
This thesis presents theory of the hot-electron effects on the device characteristics and
circuit performance, explores several approaches to improve performance at both the
device and...
Scaling the supply voltage into the sub/near-threshold domain is one of the most effective methods for improving the energy efficiency of next-generation electronic microsystems. Unfortunately, the relationship between low-voltage operation and radiation-induced soft error rate is not widely known, as little research has been previously performed and reported for soft-error...
The purpose of the thesis is to design, construct,
program, and test an automatic integrated circuit test
system. The class of integrated circuits tested was restricted
to digital integrated circuits. The general concept
of testing a digital integrated circuit is based on
the truth table of that circuit. A combination...
The object of this work was to design and fabricate an integrated circuit using Integrated Injection Logic. Integrated Injection Logic (I[superscript 2] L) is a relatively new field and has many inherent advantages. These have been exploited in this work. Logic for the desired functions was designed and implemented in...
A short-circuit-protected line-driver circuit is
particularly adapted for use in a CMOS differential line-driver
system, where one line-driver circuit provides a
true output signal, and another line-driver circuit
provides a complementary false output signal. A short-circuit
is sensed by measuring current through a secondary
pull-up transistor, and disabling a primary...
The electrical performance of on-chip interconnects has become a limiting factor to the performance of modern integrated circuits including RFICs, mixed-signal circuits, as well as high-speed VLSI circuits due to increasing operating frequencies, chip areas, and integration densities. It is advantageous to have fast and accurate closed-form expressions for the...
The electrical behavior of on-chip interconnects has become a dominant factor in silicon-based high speed, RF, and mixed-signal integrated circuits. In particular, the frequency-dependent loss mechanisms in heavily-doped silicon substrates can have a large influence on the transmission characteristics of on-chip interconnects. To optimize the performance of the integrated circuit,...