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Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

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https://ir.library.oregonstate.edu/concern/articles/1c18dh55r

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  • Structure-property relationships in ferroelectrics extend over several length scales from the individual unit cell to the macroscopic device, and with dynamics spanning a broad temporal domain. Characterizing the multi-scale structural origin of electric field-induced polarization reversal and strain in ferroelectrics is an ongoing challenge that so far has obscured its fundamental behaviour. By utilizing small intensity differences between Friedel pairs due to resonant scattering, we demonstrate a time-resolved X-ray diffraction technique for directly and simultaneously measuring both lattice strain and, for the first time, polarization reversal during in-situ electrical perturbation. This technique is demonstrated for BaTiO₃-BiZn₀.₅Ti₀.₅O₃ (BT-BZT) polycrystalline ferroelectrics, a prototypical lead-free piezoelectric with an ambiguous switching mechanism. This combines the benefits of spectroscopic and diffraction-based measurements into a single and robust technique with time resolution down to the ns scale, opening a new door to in-situ structure-property characterization that probes the full extent of the ferroelectric behaviour.
  • This is the publisher’s final pdf. The published article is copyrighted by the author(s) and published by the Nature Publishing Group. The published article can be found at: http://www.nature.com/srep/
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  • Gorfman, S., Simons, H., Iamsasri, T., Prasertpalichat, S., Cann, D. P., Choe, H., ... & Jones, J. L. (2016). Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics. Scientific Reports, 6, 20829. doi:10.1038/srep20829
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  • 6
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  • S.G., H.C. and U.P. acknowledge the funding of the German Federal Ministry of Education and Research (BMBF - Bundesministerium für Bildung und Forschung-Grant No. 05K13PSA). The contribution of J.J. was based, in part, upon work supported by the National Science Foundation, as part of the Centre for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503. H.S. acknowledges support from a Danish Council of Independent Research individual postdoctoral grant. T.I. acknowledges support from the Development and Promotion of Science and Technology Talents Project, Royal Thai Government.
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