Article
 

Growth and surface modification of LaFeO₃ thin films induced by reductive annealing

Public Deposited

Downloadable Content

Download PDF
https://ir.library.oregonstate.edu/concern/articles/d791sh99p

Descriptions

Attribute NameValues
Creator
Abstract
  • The mixed electronic and ionic conductivity of perovskite oxides has enabled their use in diverse applications such as automotive exhaust catalysts, solid oxide fuel cell cathodes, and visible light photocatalysts. The redox chemistry at the surface of perovskite oxides is largely dependent on the oxidation state of the metal cations as well as the oxide surface stoichiometry. In this study, LaFeO₃ (LFO) thin films grown on yttria-stabilized zirconia (YSZ) was characterized using both bulk and surface sensitive techniques. A combination of in situ reflection high-energy electron diffraction (RHEED), X-ray diffraction (XRD), and Rutherford backscattering spectrometry (RBS) demonstrated that the film is primarily textured in the [1 0 0] direction and is stoichiometric. High-resolution transmission electron microscopy measurements show regions that are dominated by [1 0 0] oriented LFO grains that are oriented with respect to the substrates lattice. However, selected regions of the film show multiple domains of grains that are not [1 0 0] oriented. The film was annealed in an ultra-high vacuum chamber to simulate reducing conditions and studied by angle-resolved X-ray photoelectron spectroscopy (XPS). Iron was found to exist as Fe(0), Fe(II), and Fe(III) depending on the annealing conditions and the depth within the film. A decrease in the concentration of surface oxygen species was correlated with iron reduction. These results should help guide and enhance the design of LFO materials for catalytic applications.
  • This is the publisher’s final pdf. The published article is copyrighted by Elsevier and can be found at: http://www.journals.elsevier.com/applied-surface-science
  • Keywords: Perovskite, Molecular beam epitaxy, Lanthanum iron oxide, Angle-resolved XPS, LaFeO₃
Resource Type
DOI
Date Available
Date Issued
Citation
  • Flynn, B. T., Zhang, K. H. L., Shutthanandan, V., Varga, T., Colby, R. J., Oleksak, R. P., ... Thevuthasan, S. (2015). Growth and surface modification of LaFeO₃ thin films induced by reductive annealing. Applied Surface Science, 330, 309-315. doi:10.1016/j.apsusc.2015.01.028
Journal Title
Journal Volume
  • 330
Academic Affiliation
Rights Statement
Funding Statement (additional comments about funding)
  • B.T.F. and G.S.H. gratefully acknowledge support from the Semiconductor Research Corporation under contract number 2013-OJ-2438.001 and the Center for Sustainable Materials Chemistry, which is supported by the US National Science Foundation under grant number CHE-1102637. S.A.C. and M.A.H. were supported by BES, Division of Chemical Sciences, Geosciences, and Biosciences. The research was performed using EMSL, a national scientific user facility sponsored by the Department of Energy’s Office of Biological and Environmental Research and located at Pacific Northwest National Laboratory.
Publisher
Peer Reviewed
Language
Replaces

Relationships

Parents:

This work has no parents.

Items