Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices

Citeable URL: https://ir.library.oregonstate.edu/concern/articles/qj72p858b

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Attribute Name	Values
Creator	McArthur, R. C. Davidson, J. D. Wager, J. F. Khormaei, I. King, C. N.
Abstract	The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.
Resource Type	Article
DOI	https://doi.org/10.1063/1.103078
Date Available	2010-01-27T22:42:48+00:00
Date Issued	1990-05-07
Citation	McArthur, R. C., Davidson, J. D., Wager, J. F., Khormaei, I., & King, C. N. (1990). Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 56(19), 1889-1891.
Journal Title	Applied Physics Letters
Journal Volume	56
权利声明	Copyright Not Evaluated
Publisher	The American Insitute of Physics
Language	English [eng]
Replaces	http://hdl.handle.net/1957/14136

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