Relaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices

Citeable URL: https://ir.library.oregonstate.edu/concern/articles/t722hb241

Descriptions

Attribute Name	Values
Creator	Keir, P. D. Le, H. Thuemler, R. L. Hitt, J. C. Wager, J. F.
Abstract	Anomalous charge-voltage (Q-V) characteristics are observed for several types of alternating-current thin-film electroluminescent (ACTFEL) devices. These Q-V curves are anomalous because conduction charge flows in these devices exclusively during the portion of the wave form in which the applied voltage is constant, at its maximum value; this kind of conduction charge is denoted relaxation charge. In a normal ACTFEL device, most of the conduction charge flows during the portion of the wave form in which the applied voltage increases with time. The anomalous Q-V characteristics are attributed to insulator leakage for the devices tested. Simulation shows that such anomalous behavior may arise from either insulator of phosphor leakage.
Resource Type	Article
DOI	https://doi.org/10.1063/1.117657
Date Available	2010-01-27T22:25:04+00:00
Date Issued	1996-10-14
Citation	Keir, P. D., Le, H., Thuemler, R. L., Hitt, J., & Wager, J. F. (1996). Relaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 69(16), 2421-2422.
Journal Title	Applied Physics Letters
Journal Volume	69
Rights Statement	Copyright Not Evaluated
Publisher	American Institute of Physics
Language	English [eng]
Replaces	http://hdl.handle.net/1957/14129