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Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices Public Deposited

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Article appears in Applied Physics Letters ( http://apl.aip.org/) and is copyrighted by American Institute of Physics ( http://www.aip.org/).

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  • Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a reduction in transferred charge, when an alternating-current thin-film electroluminescent (ACTFEL) device is operated at an elevated temperature. EL thermal quenching is found to be significant in SrS:Cu ACTFEL devices operated above ~60-80 °C. Maximum transferred charge-maximum applied voltage (Qmax-Vmax) and transferred charge capacitance (i.e., dQmax /dVmax vs Vmax) measurements as a function of temperature in conjunction with ACTFEL device simulation are employed in order to establish that EL thermal quenching arises from a thermally activated annihilation of positive space charge and a corresponding increase in the threshold voltage.
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  • Baukol, B. A., Hitt, J. C., Keir, P. D., & Wager, J. F. (2000). Electroluminescence thermal quenching in SrS:Cu thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 76(2), 185-187.
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