Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices Public Deposited

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Article appears in Applied Physics Letters ( http://apl.aip.org/) and is copyrighted by American Institute of Physics ( http://www.aip.org/).

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  • The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.
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  • McArthur, R. C., Davidson, J. D., Wager, J. F., Khormaei, I., & King, C. N. (1990). Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 56(19), 1889-1891.
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  • description.provenance : Made available in DSpace on 2010-01-27T22:42:48Z (GMT). No. of bitstreams: 1 ApplPhysLett_56_1889.pdf: 380389 bytes, checksum: bfb4c201130ee94db12f7b3d89a36468 (MD5) Previous issue date: 1990-05-07
  • description.provenance : Submitted by David Moynihan (dmscanner@gmail.com) on 2010-01-27T20:48:41Z No. of bitstreams: 1 ApplPhysLett_56_1889.pdf: 380389 bytes, checksum: bfb4c201130ee94db12f7b3d89a36468 (MD5)
  • description.provenance : Approved for entry into archive by Linda Kathman(linda.kathman@oregonstate.edu) on 2010-01-27T22:42:48Z (GMT) No. of bitstreams: 1 ApplPhysLett_56_1889.pdf: 380389 bytes, checksum: bfb4c201130ee94db12f7b3d89a36468 (MD5)

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