Relaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices Public Deposited

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Article appears in Applied Physics Letters ( http://apl.aip.org/) and is copyrighted by American Institute of Physics ( http://www.aip.org/).

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  • Anomalous charge-voltage (Q-V) characteristics are observed for several types of alternating-current thin-film electroluminescent (ACTFEL) devices. These Q-V curves are anomalous because conduction charge flows in these devices exclusively during the portion of the wave form in which the applied voltage is constant, at its maximum value; this kind of conduction charge is denoted relaxation charge. In a normal ACTFEL device, most of the conduction charge flows during the portion of the wave form in which the applied voltage increases with time. The anomalous Q-V characteristics are attributed to insulator leakage for the devices tested. Simulation shows that such anomalous behavior may arise from either insulator of phosphor leakage.
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  • Keir, P. D., Le, H., Thuemler, R. L., Hitt, J., & Wager, J. F. (1996). Relaxation charge anomalies in the charge–voltage characteristics of alternating-current thin-film electroluminescent devices [Electronic version]. Applied Physics Letters, 69(16), 2421-2422.
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  • description.provenance : Approved for entry into archive by Linda Kathman(linda.kathman@oregonstate.edu) on 2010-01-27T22:25:03Z (GMT) No. of bitstreams: 1 ApplPhysLett_69_2421.pdf: 37587 bytes, checksum: 2511d9a01d2333edd28e9ed6def69f87 (MD5)
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