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passed 2 Files with 2 total versions checked 2022-06-21 21:05:40 -0700
File Format: pdf (Portable Document Format)
File Title: Hot Carrier Degradation of Sub-Micron n-channel MOSFETs Subject to Static Stress
Page Count: 66
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User Scholars Archive Admin has attached AminzadehPaymanG1994.pdf to Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress August 4th, 2017 08:31