AminzadehPaymanG1994.pdf Public
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- Depositor
- Scholars Archive Admin
- Date Uploaded
- 2017-08-04
- Date Modified
- 2017-08-04
- Fixity Check
- passed 2 Files with 2 total versions checked 2022-06-21 21:05:40 -0700
- Characterization
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File Format: pdf (Portable Document Format)File Title: Hot Carrier Degradation of Sub-Micron n-channel MOSFETs Subject to Static StressPage Count: 66File Size: 2374787Original Checksum: 2cfcb35dd575096c8ec5522b43805907Mime Type: application/pdf
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User Scholars Archive Admin has attached AminzadehPaymanG1994.pdf to Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress |
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