Downloadable Content

Download PDF

AminzadehPaymanG1994.pdf Public

File Details

Depositor
Scholars Archive Admin
Date Uploaded
Date Modified
2017-08-04
Fixity Check
Fixity checks have not yet been run on this object
Characterization
File Format: pdf (Portable Document Format)
File Title: Hot Carrier Degradation of Sub-Micron n-channel MOSFETs Subject to Static Stress
Page Count: 66
Original Checksum: 2cfcb35dd575096c8ec5522b43805907
Mime Type: application/pdf
User Activity Date
User Scholars Archive Admin has attached AminzadehPaymanG1994.pdf to Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress August 4th, 2017 08:31