Detalhes Do Ficheiro

Depositante

Scholars Archive Admin

Data Carregado

2017-08-04

Data Modificada

2017-08-04

Fixidez De Seleção

passed 2 File with 2 total version checked 2024-04-15 14:46:26 -0700

Caracterização

File Format: pdf (Portable Document Format)

File Title: Hot Carrier Degradation of Sub-Micron n-channel MOSFETs Subject to Static Stress

Page Count: 66

File Size: 2374787

Original Checksum: 2cfcb35dd575096c8ec5522b43805907

Mime Type: application/pdf