kratzer-aaron-physics-thesis_2014.pdf Public
File Details
- Depositor
- Scholars Archive Admin
- Date Uploaded
- 2017-07-21
- Date Modified
- 2017-07-21
- Fixity Check
- passed 2 Files with 2 total versions checked 2024-04-15 14:05:50 -0700
- Characterization
-
File Format: pdf (Portable Document Format)Page Count: 15File Size: 3189129Original Checksum: d603dc23ef47adda89b1b9a965e90ec1Mime Type: application/pdf
| User Activity | Date |
|---|---|
| User Scholars Archive Admin has attached kratzer-aaron-physics-thesis_2014.pdf to Measurement and Modeling of Zinc Sulfide Thin Films using Ellipsometry and Reflection Spectroscopy: A Comparison of Optical Characterization Techniques |
|