HwangNam1994.pdf Public
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- 2017-08-15
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File Format: pdf (Portable Document Format)File Title: .Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistors
Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistorsPage Count: 190File Size: 16409682Original Checksum: 50487b1c1a0102c4386d65b7584e9d1eMime Type: application/pdf
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