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Single fault detection in combinational logic circuits Public Deposited

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https://ir.library.oregonstate.edu/concern/graduate_projects/tb09jd68n

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  • The material in this paper is divided into the following four chapters for convenience. Chapter 1 explains, how the idea of fault testing changed from testing the machine instructions to testing the hardware in logic circuits. Chapters 2, 3 and 4 present the different approaches considered, namely: 1. Path sensitizing and D-Algorithm method. 2. Tabular method. 3. Boolean difference method.
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