Graduate Thesis Or Dissertation

 

DC/AC Stability of In-Ga-Zn-O Thin-Film Transistors Public Deposited

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https://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/5h73q182n

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  • The electrical stability of amorphous indium-gallium-zinc oxide (a-IGZO) thinfilmtransistors (TFTs) is investigated for flat-panel display applications. Althoughproducts incorporating a-IGZO TFT backplanes are already commercially available,e.g., iMac with 5K retina display, technical challenges need to be addressed for nextgenerationapplications, e.g., active-matrix organic light-emitting diode displays.Device stability is one crucial issue. The objective of the research presented herein isto provide an in-depth assessment of the effect of DC and AC bias temperature stresson the stability of a-IGZO TFTs. It is found that TFT threshold voltage instability,ΔVTH, is reduced by decreasing the unipolar AC duty ratio, decreasing the operationtemperature, using a bipolar AC waveform rather than a unipolar waveform, oremploying an optimized passivation layer that suppresses moisture incorporation intothe a-IGZO channel layer. A two-parameter stretched-exponential expression is usedto describe the time-dependent instability trend. The long-term reliability of an a-IGZOTFT as a function of gate voltage, temperature, or duty ratio is successfully modeledusing the two-parameter stretched-exponential expression. The stretched-exponentialactivation energy is correlated with the Meyer-Neldel rule activation entropy.Technology computer-aided design (TCAD) simulation provides insight into thenatural of a-IGZO TFT instability from the perspective of the subgap density of states(DOS). It is found that less DOS change results in a more stable TFT.
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  • description.provenance : Approved for entry into archive by Julie Kurtz(julie.kurtz@oregonstate.edu) on 2017-09-21T18:28:52Z (GMT) No. of bitstreams: 2license_rdf: 1527 bytes, checksum: d4743a92da3ca4b8c256fdf0d7f7680f (MD5)ZhouFan2017.pdf: 7810463 bytes, checksum: d4a99187d5417adda40735fd3a853663 (MD5)
  • description.provenance : Approved for entry into archive by Margaret Mellinger(margaret.mellinger@oregonstate.edu) on 2017-10-20T16:47:27Z (GMT) No. of bitstreams: 2license_rdf: 1527 bytes, checksum: d4743a92da3ca4b8c256fdf0d7f7680f (MD5)ZhouFan2017.pdf: 7810463 bytes, checksum: d4a99187d5417adda40735fd3a853663 (MD5)
  • description.provenance : Made available in DSpace on 2017-10-20T16:47:27Z (GMT). No. of bitstreams: 2license_rdf: 1527 bytes, checksum: d4743a92da3ca4b8c256fdf0d7f7680f (MD5)ZhouFan2017.pdf: 7810463 bytes, checksum: d4a99187d5417adda40735fd3a853663 (MD5)
  • description.provenance : Submitted by Fan Zhou (zhoufa) on 2017-09-14T22:58:58ZNo. of bitstreams: 2license_rdf: 1527 bytes, checksum: d4743a92da3ca4b8c256fdf0d7f7680f (MD5)ZhouFan2017.pdf: 7810463 bytes, checksum: d4a99187d5417adda40735fd3a853663 (MD5)
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  • Existing Confidentiality Agreement
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  • 2017-11-08 to 2019-10-21

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