The chemistry and device applications of amorphous thin-film interfaces Public Deposited

http://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/8k71nk798

Descriptions

Attribute NameValues
Creator
Abstract or Summary
  • Solid-state amorphous materials show amazing promise in thin-film electronics. The interface-to-bulk ratio of thin films makes interfacial chemistries of these systems of utmost importance. Thin films of amorphous metals, dielectrics and semiconductors have novel chemistries that are not only based upon their elemental constituent makeup, but also based upon the method with which the amorphous material is deposited and treated after deposition. The chemical attributes unique to amorphous, thin-film systems are defined primarily through the utilization of solution-processed aluminum oxide phosphate dielectric material and Zr₄₀Cu₃₅Al₁₅Ni₁₀ metal. the chemical findings wrought via the observation of interactions between amorphous metal-dielectric systems are applied to semiconductor/insulator systems to illustrate the use of the same general chemical principles applying to diverse problems. Finally in the appendices, the systems are utilized to create extremely-thin tunneling electronic devices and optical metamaterials as well as innovative classroom material.
Resource Type
Date Available
Date Copyright
Date Issued
Degree Level
Degree Name
Degree Field
Degree Grantor
Commencement Year
Advisor
Committee Member
Academic Affiliation
Non-Academic Affiliation
Keyword
Subject
Rights Statement
Peer Reviewed
Language
Replaces
Additional Information
  • description.provenance : Approved for entry into archive by Laura Wilson(laura.wilson@oregonstate.edu) on 2011-12-14T17:51:22Z (GMT) No. of bitstreams: 3 license_rdf: 21097 bytes, checksum: 5bf191b3a24b165cbb41eaa10f132e9c (MD5) license_text: 0 bytes, checksum: d41d8cd98f00b204e9800998ecf8427e (MD5) KnutsonChristopherC2011.pdf: 5948704 bytes, checksum: 64ccf5751b98cd58898681e68ecfb172 (MD5)
  • description.provenance : Approved for entry into archive by Julie Kurtz(julie.kurtz@oregonstate.edu) on 2011-12-13T17:09:14Z (GMT) No. of bitstreams: 3 license_rdf: 21097 bytes, checksum: 5bf191b3a24b165cbb41eaa10f132e9c (MD5) license_text: 0 bytes, checksum: d41d8cd98f00b204e9800998ecf8427e (MD5) KnutsonChristopherC2011.pdf: 5948704 bytes, checksum: 64ccf5751b98cd58898681e68ecfb172 (MD5)
  • description.provenance : Submitted by Christopher Knutson (knutchri@onid.orst.edu) on 2011-12-08T23:29:32Z No. of bitstreams: 3 KnutsonChristopherC2011.pdf: 5948704 bytes, checksum: 64ccf5751b98cd58898681e68ecfb172 (MD5) license_rdf: 21097 bytes, checksum: 5bf191b3a24b165cbb41eaa10f132e9c (MD5) license_text: 0 bytes, checksum: d41d8cd98f00b204e9800998ecf8427e (MD5)
  • description.provenance : Made available in DSpace on 2011-12-14T17:51:23Z (GMT). No. of bitstreams: 3 license_rdf: 21097 bytes, checksum: 5bf191b3a24b165cbb41eaa10f132e9c (MD5) license_text: 0 bytes, checksum: d41d8cd98f00b204e9800998ecf8427e (MD5) KnutsonChristopherC2011.pdf: 5948704 bytes, checksum: 64ccf5751b98cd58898681e68ecfb172 (MD5) Previous issue date: 2011-10-20

Relationships

In Administrative Set:
Last modified: 08/08/2017

Downloadable Content

Download PDF
Citations:

EndNote | Zotero | Mendeley

Items