## A mathematical method of evaluating the reliability of electronic equipment Public Deposited

http://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/f4752m120

## Descriptions

Attribute NameValues
Creator
Abstract or Summary
• Reliability, the probability that a system will not fail but will perform correctly at least until some arbitrary time, is becoming an increasingly important concept in electronic system design. This probability is evaluated using probability density functions which are obtained analytically by forming mathematical expressions describing the failure distributions of the systems. The most commonly used expression in reliability studies is the exponential function where the reciprocal of its mean corresponds to a failure rate. When several assumptions are made, the failure rate of the system is equal to the sum to the failure rates of the components which comprise the system. After the empirical failure rate values of the components have been adjusted to conform to thermal and electrical stress conditions, they may be summed to obtain the failure rate of the system. This method was used to calculate the failure rates for various military electronic equipment. The calculated results were in close agreement with the experimental failure rates of this equipment. On-off power cycling must also be considered in reliability studies since it has the effect of adding a substantial increment of value to the basic failure rate of a system. The effective failure rate and thus reliability of a system may be found by summing the basic failure rate and the increment of value due to power cycling. It was found, using multiple regression analysis and the results from an ARINC study of cycling failure rates of various equipment, that the increment of value added to the basic system failure rate might be predicted by considering only the tubes in a system and its power cycling rate.
Resource Type
Date Available
Date Copyright
Date Issued
Degree Level
Degree Name
Degree Field
Degree Grantor
Commencement Year
Advisor
Academic Affiliation
Non-Academic Affiliation
Subject
Rights Statement
Peer Reviewed
Language
Digitization Specifications
• File scanned at 300 ppi using ScandAll PRO 1.8.1 on a Fi-6670 in PDF format. CVista PdfCompressor 5.0 was used for pdf compression and textual OCR.
Replaces
Additional Information
• description.provenance : Rejected by Patricia Black(patricia.black@oregonstate.edu), reason: Replace on 2014-06-11T15:02:44Z (GMT)
• description.provenance : Approved for entry into archive by Katy Davis(kdscannerosu@gmail.com) on 2014-06-16T17:19:13Z (GMT) No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2745634 bytes, checksum: 0248cc731a3c5278f95b5f41cbecd8d5 (MD5)
• description.provenance : Approved for entry into archive by Patricia Black(patricia.black@oregonstate.edu) on 2014-05-28T14:07:51Z (GMT) No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2794552 bytes, checksum: e8848fa70d879737819f95da1a386953 (MD5)
• description.provenance : Made available in DSpace on 2014-06-16T17:19:14Z (GMT). No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2745634 bytes, checksum: 0248cc731a3c5278f95b5f41cbecd8d5 (MD5) Previous issue date: 1964-07-24
• description.provenance : Submitted by Sergio Trujillo (jstscanner@gmail.com) on 2014-06-11T15:16:48Z No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2745634 bytes, checksum: 0248cc731a3c5278f95b5f41cbecd8d5 (MD5)
• description.provenance : Approved for entry into archive by Patricia Black(patricia.black@oregonstate.edu) on 2014-06-11T15:23:53Z (GMT) No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2745634 bytes, checksum: 0248cc731a3c5278f95b5f41cbecd8d5 (MD5)
• description.provenance : Submitted by Sergio Trujillo (jstscanner@gmail.com) on 2014-05-27T20:22:17Z No. of bitstreams: 1 LindquistClaudeSteward1965.pdf: 2794552 bytes, checksum: e8848fa70d879737819f95da1a386953 (MD5)

## Relationships

Parents:

This work has no parents.

Last modified

Download PDF