Graduate Thesis Or Dissertation
 

Experimental verification of a new model for bipolar transistor flicker noise

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  • Previous studies on low frequency flicker noise in bipolar junction transistors (BJT) are reviewed. The original BJT flicker noise sources are mainly attributed to the fluctuation in base surface recombination and the fluctuation in the mobility or diffusivity of free charge carriers. Our experiments were done to verify a newly established low frequency noise model in BJTs that depends not only on emitter current, but also on emitter-collector voltage. Two experimental systems were used for noise measurement. The automated system is effective for the measurement of flicker noise of BJT operating in the low frequency range (around 1Hz), while the analog system is efficient for the noise measurement of BJT operating in the high frequency range (around 1 KHz). Normal commercially available BJTs (PNP2907A and NPN2222A), special low noise and low power BJTs (PNP4125, NPN4124), and PMOSFETs were used in our measurements. The results of our experimental measurements indicate that BJT low frequency flicker noise is not only dependent on its emitter-collector current as described in the SPICE models, but is also strongly dependent on emitter-collector voltage which is not included in the SPICE models. Substantial power dissipation occurs in BJT's. A new model is thus proposed to demonstrate that the noise current is not just simply a function of collector current but rather power dissipation (I*V). Temperature fluctuations caused by significant heat generation and heat conduction due to high power dissipation have been suggested to result in the flicker noise in transistors. A detailed comparison of experimental data with the calculated data from the model has been made to verify the newly proposed model. It is demonstrated that the new noise model fits our experiment measurements very well in the high frequency range. However, there is some discrepancy between the experimental data and the calculated data in the low frequency region. Future work needs to be continued to refine the BJT flicker noise model by both theory and experiments.
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