Quantitative trait loci mapping of yield, its related traits, and spike morphology factors in winter wheat (Triticum aestivum L.) Public Deposited

http://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/js956k01k

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  • Increasing grain yield in wheat (Triticum aestivum L.) is a challenging task, because yield is a complex trait controlled by many genes and highly influenced by environmental factors. The genetic control of yield components and other traits associated with yield may be less complex and thus more manageable for breeding. This study seeks to identify quantitative trait loci (QTLs) for these traits. Two new genetic linkage maps were constructed from recombinant inbred lines (RILs) derived from crosses between the Oregon soft white winter wheat variety Tubbs and a Western European hard red winter wheat variety, Einstein. A third linkage map was constructed from RILs from a cross with Tubbs and a Western European experimental hard red winter wheat line. A combination of Diversity Arrays Technology (DArT), Simple Sequence Repeat (SSR), orw5, and B1 markers were used to construct genetic linkage maps. Two replications of the RIL populations were grown in yield trial sized plots at Corvallis, OR and Pendleton, OR in 2009. The RILs were evaluated for grain yield, spikes per m², fertile spikelets per spike, sterile spikelets per spike, seeds per spike, seeds per fertile spikelet, average seed weight, growing degree days (GDD) to flowering, GDD to physiological maturity, GDD of grain fill, plant height, test weight, and percent grain protein. Composite interval mapping (CIM) detected 146 QTLs for these traits spread across all chromosomes except for 6D. Thirty six percent of all of the QTLs detected were in close proximity to four loci: Rht-B1, Rht-D1, B1, and Xgwm372. The use of factor analysis to aid in QTL mapping for correlated traits related to spike morphology was explored. Quantitative trait loci mapping of factor scores for these traits potentially showed an increase in statistical power to detect QTLs and a decrease in the probability of type I error over mapping the traits individually.
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