Opamp characterization techniques Public Deposited

http://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/rx913s25t

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  • Standard methodologies exist for testing and characterizing digital circuits but the same cannot be said of analog circuits. Though much theoretical work has been done to model the linear and nonlinear aspects of analog circuits, a firm practical background for the design of testable analog cells has yet to be set. The industry largely looks for solutions wherein some form of built in self-test (BIST) can be incorporated into the analog circuits to make the testing at the manufacturing level easy and accurate. Since the testers in the industry are generally digital, test circuits that use logic levels at the output to make measurements are attractive. This thesis examines the design of such test circuits for one specific analog circuit, the opamp. Test circuits to measure the gain, gain-bandwidth product, phase response and the slew rate of the opamp have been designed and experimental results are presented. The main advantages of these tests are that they are simple, fast, accurate and easy to incorporate in an integrated circuit.
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  • File scanned at 300 ppi (Monochrome, 8-bit Grayscale) using ScandAll PRO 1.8.1 on a Fi-6770A in PDF format. CVista PdfCompressor 4.0 was used for pdf compression and textual OCR.
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  • description.provenance : Approved for entry into archive by Patricia Black(patricia.black@oregonstate.edu) on 2012-12-13T20:55:16Z (GMT) No. of bitstreams: 1 RamamurthyKarthik1994.pdf: 3124424 bytes, checksum: e3b29695d2d60ac15d550a3cb9c976d6 (MD5)
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