Measurement and analysis of soft error vulnerability of low-voltage logic and memory circuits Public Deposited

http://ir.library.oregonstate.edu/concern/graduate_thesis_or_dissertations/t722hc71m

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  • Scaling the supply voltage into the sub/near-threshold domain is one of the most effective methods for improving the energy efficiency of next-generation electronic microsystems. Unfortunately, the relationship between low-voltage operation and radiation-induced soft error rate is not widely known, as little research has been previously performed and reported for soft-error susceptibility of on-chip memory and logic at very low supply voltages. This information is critical for low-voltage circuit designers, as many applications that would benefit from the energy effi­ciency of sub/near-threshold also require high reliability. This work first details the design and implementation of a portable soft error reference platform, specif­ically targeting very low-voltage operation. The circuit-level details of a TSMC 65nm test-chip design are given, along with an analysis of data from experiments performed at Los Alamos Neutron Science Center (LANSCE) and the OSU Radi­ation Center. Once this soft-error rate is known, error resiliency techniques must be utilized for increased processor reliability. The design and implementation of an error-resilient, near-threshold SIMD processor in an IBM 45nm SOI process will also be covered. This prototype demonstrates both increased reliability and improved throughput over a conventional SIMD pipeline while operating in near-threshold.
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  • description.provenance : Approved for entry into archive by Julie Kurtz(julie.kurtz@oregonstate.edu) on 2014-07-24T20:21:23Z (GMT) No. of bitstreams: 2 license_rdf: 1232 bytes, checksum: bb87e2fb4674c76d0d2e9ed07fbb9c86 (MD5) PawlowskiRobertS2015.pdf: 18703204 bytes, checksum: 14121aa1e1442720a6e8c3ddc2963352 (MD5)
  • description.provenance : Made available in DSpace on 2014-07-24T22:48:10Z (GMT). No. of bitstreams: 2 license_rdf: 1232 bytes, checksum: bb87e2fb4674c76d0d2e9ed07fbb9c86 (MD5) PawlowskiRobertS2015.pdf: 18703204 bytes, checksum: 14121aa1e1442720a6e8c3ddc2963352 (MD5) Previous issue date: 2014-07-14
  • description.provenance : Approved for entry into archive by Laura Wilson(laura.wilson@oregonstate.edu) on 2014-07-24T22:48:10Z (GMT) No. of bitstreams: 2 license_rdf: 1232 bytes, checksum: bb87e2fb4674c76d0d2e9ed07fbb9c86 (MD5) PawlowskiRobertS2015.pdf: 18703204 bytes, checksum: 14121aa1e1442720a6e8c3ddc2963352 (MD5)
  • description.provenance : Submitted by Robert Pawlowski (pawlowsr@onid.orst.edu) on 2014-07-22T18:31:50Z No. of bitstreams: 2 license_rdf: 1232 bytes, checksum: bb87e2fb4674c76d0d2e9ed07fbb9c86 (MD5) PawlowskiRobertS2015.pdf: 18703204 bytes, checksum: 14121aa1e1442720a6e8c3ddc2963352 (MD5)

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