Technical Report
 

The Rapid-Sampling Vertical Profiler : test cruise, July 1982

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  • In this report we describe a preliminary version of a temperature/conductivity profiler that combines the calibration accuracy of a CTD with the vertical resolution of a microstructure instrument and the ease of deployment of an XBT. We also describe the results of a test of this version on a month-long cruise from Honolulu to 42 N and back in July 1982. This instrument system, which we call the Rapid-Sampling Vertical Profiler, has two versions. One uses a Neil Brown conductivity transducer and a fast-tip thermistor as sensors, and has a vertical resolution of 3 cm in salinity and temperature. The other has a micro-scale conductivity sensor, with a fast-tip thermistor. It has a resolution of less than one millimeter in conductivity,·but only 3 cm in the thermistor signal so that density information can still only be acquired on the 3-cm scale.
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  • Master files scanned at 600 ppi (256 Grayscale) using Capture Perfect 3.0 on a Canon DR-9080C in TIF format. PDF derivative scanned at 300 ppi (256 Grayscale + 265 b+w), using Capture Perfect 3.0, on a Canon DR-9080C. CVista PdfCompressor 3.1 was used for pdf compression and textual OCR.
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