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Filtering by: Advisor McClellan, T. J. Academic Affiliation Electrical and Computer Engineering

Injection of electrons into silicon dioxide from planar silicon substrates

Creator:

Rode, Ajit G.

Resource Type:

Dissertation

Full Text:

current I SR Reverse source current I t Peak value of oxide current J Current density jdiff
Defects and transport properties in In(1-x)Ga(x)As(y)P(1-y) and Ga(1-x)Al(x)As

Creator:

Ku, Joseph W.

Resource Type:

Dissertation

Full Text:

analyses of the mobility and concentration data for T > 350°K. The electrical properties of
Electrical and optical properties of semi-insulating and ion-implanted GaAs and InP

Creator:

Rhee, Jin Koo

Abstract:

The electrical and optical properties of semi-insulating, epitaxial and ion-implanted GaAs and InP have been characterized and analyzed. Electron and hole traps in semi-insulating GaAs and InP, with activation energies ΔE[subscript T] ranging from 0.16 ± 0.01 to 0.98 ± 0.01 eV, have been detected and characterized by Photo-Induced Current...

Resource Type:

Dissertation

Full Text:

measurements were com- plemented by Hall measurements at T > 300K and photocurrent spectra measurements. The