Index Catalog // ScholarsArchive@OSU

Impact excitation efficiency in AC-driven thin-film electroluminescent devices

Creator:: Peter, Manuela
Resource Type:: Masters Thesis
Full Text:: Impact excitation efficiency in AC-driven thin-film

Alternating-current thin-film electroluminescent device fabrication and characterization

Creator:: Baukol, Beau
Resource Type:: Dissertation
Full Text:: Alternating-Current Thin-Film Electroluminescent Device Fabrication and Characterization by Beau Baukol A

Detection of exciton polaritons in organic thin film TES-ADT

Creator:: Haas, David P.
Abstract:: Exciton polaritons are quasiparticles composed of a quantum superposition of matter and light states that arises from the coupling of a standing wave photon and an exciton. This research has two primary objectives: to design and fabricate a Fabry-Perot microcavity system in which to produce exciton polaritons; and to show...
Resource Type:: Undergraduate Thesis
Full Text:: e-beam deposition to coat a glass slide with silver, then spin cast a thin film of PMMA mixed with

Scaling of thin-film Nd₁.₈₅Ce₀.₁₅CuO[subscript 4-y] resistivity-current isotherms at low fields: Implications for vortex phase transitions and universality

Creator:: Roberts, J. M., Brown, Brandon, Tate, Janet, Xi, X. X., and Mao, S. N.
Abstract:: We have investigated a second-order phase transition of the vortex lattice in thin-film Nd₁.₈₅Ce₀.₁₅CuO[subscript 4-y] from 1 mT to 1 T applied magnetic fields. The dc resistivity-current density data for each field exhibit critical scaling consistent with a second-order vortex-liquid to vortex-solid phase transition. The high-field data support the vortex-glass...
Resource Type:: Article
Full Text:: Scaling of thin-film Nd_{1.85}Ce_{0.15}CuO_{4-y

Zinc Tin Oxide Thin Films by Pulsed Laser Deposition for use in Transparent Thin-Film Transistors

Creator:: Osborne, James J.
Abstract:: Zinc tin oxide (ZTO) films deposited by pulsed laser deposition (PLD) are investigated as a channel layers for transparent thin-film transistors (TTFTs). Films are deposited on glass for characterization, and transistor channel layers are deposited onto aluminum oxide-titanium oxide/tin doped indium oxide/glass substrates (ATO/ITO/glass) to produce TTFTs. UV-visible spectroscopy on...
Resource Type:: Masters Thesis
Full Text:: Laser Deposition for use in Transparent Thin-Film Transistors Abstract approved: Dr. Janet Tate Zinc

Spectroscopic Ellipsometry on Thin Films of TiO2: Comparing Cauchy and Cody-Loretnz Models in CompleteEASE

Creator:: Kreb, Joseph
Abstract:: Spectroscopic ellipsometry (SE) is used to characterize amorphous and crystalline thin films of TiO2. Amorphous precursor films of TiO2 are deposited by radio frequency magnetron sputtering on fused silica and silicon substrates. Annealing the amorphous precursor films induces them to crystallize into either pure or mixed phases of the three...
Resource Type:: Undergraduate Thesis
Full Text:: deposition parameters. A set of thin film samples has been made at varying sputtered deposition parameters

Optical Analysis of Titania : Band Gaps of Brookite, Rutile and Anatase

Creator:: Lance, Ryan A.
Abstract:: The optical transition in high-fraction polymorphs of titania (TiO2) were investigated to determine the band gap behavior of the most common polymorphs—brookite, rutile, and anatase—the values of which are varied in the literature. The direct optical band gaps of brookite, rutile, and anatase, were determined to be 3.37(7)eV, 3.41(11)eV and...
Resource Type:: Undergraduate Thesis
Full Text:: of high-phase brookite, anatase and rutile in thin film form, and transmission and reflection spectra

Linear and nonlinear optical investigation of films : I. Formalism for time resolved multi-photon processes. II. Detection of solid water phase transitions on Si-SiO₂ III. Wave guided CARS spectroscopy

Creator:: Zagone, Robin L.
Abstract:: Nonlinear optical processes can be described as multiphoton scattering events in terms of high order perturbation theory. The standard procedure for quantitative calculation of high order terms is to impose a steady state condition on the perturbative radiation fields. In the present work, this condition will be lifted, and explicit...
Resource Type:: Dissertation

Resistance in superconductors : a comparison between NdCeCuO and YBaCuO thin films

Creator:: Hermann, Bianca A.
Resource Type:: Masters Thesis
Full Text:: Stable current-voltage characteristics and resistance-temperature curves for thin-film samples of the

Magneto-crystalline anisotropy calculation in thin films with defects

Creator:: Matusevich, David Sergio
Abstract:: The code is developed for the calculation of the magneto-crystalline anisotropy (MAE) in thin films using a classical Heisenberg hamiltonian with a correction developed by Van Vleck. A Metropolis style Monte Carlo algorithm was used with adequate corrections to accelerate the calculation. The MAE was calculated for the case of...
Resource Type:: Dissertation
Full Text:: case of a thin film with an increasing number of defects on the top layer for the cases where the

ScholarsArchive@OSU

Impact excitation efficiency in AC-driven thin-film electroluminescent devices

Alternating-current thin-film electroluminescent device fabrication and characterization

Detection of exciton polaritons in organic thin film TES-ADT

Scaling of thin-film Nd₁.₈₅Ce₀.₁₅CuO[subscript 4-y] resistivity-current isotherms at low fields: Implications for vortex phase transitions and universality

Zinc Tin Oxide Thin Films by Pulsed Laser Deposition for use in Transparent Thin-Film Transistors

Spectroscopic Ellipsometry on Thin Films of TiO2: Comparing Cauchy and Cody-Loretnz Models in CompleteEASE

Optical Analysis of Titania : Band Gaps of Brookite, Rutile and Anatase

Linear and nonlinear optical investigation of films : I. Formalism for time resolved multi-photon processes. II. Detection of solid water phase transitions on Si-SiO₂ III. Wave guided CARS spectroscopy

Resistance in superconductors : a comparison between NdCeCuO and YBaCuO thin films

Magneto-crystalline anisotropy calculation in thin films with defects

Limit your search

Academic Affiliation

Advisor

Commencement Year

Committee Member

Creator

Contributor

Date

Decade

Degree Field

Degree Level

Degree Name

File Format

Language

License

Non-Academic Affiliation

Peer Reviewed

Resource Type

Rights Statement

Subject

Search Constraints

Search Results

Limit your search