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Filtering by: Creator Hu, Chin-Hwa Advisor Conley, John F., jr. Committee Member Tate, Janet

Investigation of Energy Barrier Heights within Metal-insulator-metal Devices via Internal Photoemission Spectroscopy

Creator:

Jenkins, Melanie A.

Abstract:

Metal-insulator-metal (MIM) and dual-insulator MIM (MIIM) devices are used in rectennas, hot-electron transistors, single electron transistors, resistive random access memory (RRAM), and capacitors. The performance of these devices relies heavily on the energy barrier height at each metal-insulator interface. Thus, determination of the in-situ electron energy barrier at each interface...

Resource Type:

Dissertation

Full Text:

, J.F. Conley, Jr., D.R. Evans, M. Chin, S.J. Kilpatrick, and M. Dubey, “Impact of Electrode Roughness