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Filtering by: Advisor Dietterich, Thomas G. Date issued sim 1998-08-21

Just enough die-level functional test : optimizing IC test via machine learning and decision theory

Creator:

Fountain, Tony R.

Abstract:

This research explores the hypothesis that methods from decision theory and machine learning can be combined to provide practical solutions to current manufacturing control problems. This hypothesis is explored by developing an integrated approach to solving one manufacturing problem - the optimization of die-level functional test. An integrated circuit (IC)...

Resource Type:

Dissertation