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Filtering by: Subject Hot carriers Advisor Forbes, Leonard

Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistors

Creator:

Hwang, Nam

Resource Type:

Dissertation

Full Text:

projections of hot-carrier effects in CMOS transistors AN ABSTRACT OF THE THESIS OF Nam Hwang for the
Hot electron effects in N-channel MOSFET's

Creator:

Or, Siu-shun Burnette

Abstract:

The purpose of this work is to develop a new model for LDD n-MOSFET degradation in drain current under long-term AC use conditions for lifetime projection which includes a self-limiting effect in the hot-electron induced device degradation. Experimental results on LDD n-channel MOSFETs shows that the maximum drain current degradation...

Resource Type:

Masters Thesis

Full Text:

with different drawn gate length 4 Figure 2. A schematic diagram for hot-carrier mechanisms on LDD
Reliability and hot-electron effects in analog and mixed-mode circuits

Creator:

Ge, David Ying

Abstract:

Reliability of sub-micron analog circuits is directly related to impact ionization and the subsequent changes in threshold voltage and drain current of n-MOSFET devices. This thesis presents theory of the hot-electron effects on the device characteristics and circuit performance, explores several approaches to improve performance at both the device and...

Resource Type:

Masters Thesis

Full Text:

complexity. Several hot-electron injection mechanisms have been proposed for hot electron-carrier