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Filtering by: Doppler broadening Remove constraint Doppler broadening Advisor Piepmeier, Edward H. Remove constraint Advisor: Piepmeier, Edward H. Subject Atomic spectroscopy -- Instruments Remove constraint Subject: Atomic spectroscopy -- Instruments

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  • Fundamental studies of a gas-jet enhanced sputtering system and its applications

    Creator:
    Kim, Hyo-jin
    Abstract:
    The use of gas jets in a sputtering cell makes this direct sampling method practical for atomic absorption and mass spectrometry determinations. With a commercial six-jet sputtering source, the Atomsource (Analyte Corp., Grants Pass, Oregon), that directly atomizes solid samples for conventional atomic absorption spectrophotometers, the sample loss rate for...
    Resource Type:
    Dissertation
    Full Text:
    ]. The maximum Doppler temperature measured in the side-view lamp, as derived from the Cr 428.9 nm line