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Filtering by: Advisor Tate, Janet Advisor Mcintyre, David H. Resource Type Undergraduate Thesis

Creator:: Prudell, Kathleen
Abstract:: A method has been developed to measure the thickness of ZnS thin films on Si using optical interference. Thin film optical interference fringes are dependent upon the thickness of the film, and for this reason the thickness can be determined by measuring reflectance spectrum of a thin film. A grating...
Resource Type:: Undergraduate Thesis

ScholarsArchive@OSU