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Filtering by: Advisor Wager, John F. Committee Member Goodnick, S. M. Decade 1990-1999

Internal charge-phosphor field analysis, electrical characterization, and aging studies of AC thin-film electroluminescent devices

Creator:

Abu-Dayah, Ahmad I.

Resource Type:

Masters Thesis
Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

Creator:

Aminzadeh, Payman G.

Abstract:

Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...

Resource Type:

Masters Thesis