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Filtering by: Alternative title ssim EM 8270 Committee Member Arthur, John

Physical mechanisms, device models, and lifetime projections of hot-carrier effects in CMOS transistors

Creator:

Hwang, Nam

Resource Type:

Dissertation

Full Text:

(Isub) model which is a function of DC biases is given by [64]; Ids Ai Em Id Bi Isub = Bi exp(--Em