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Filtering by: Committee Member Conley, John F., Jr Remove constraint Committee Member: Conley, John F., Jr Date issued sim 2008-10-31 Remove constraint Date issued sim: 2008-10-31 Peer Reviewed No Remove constraint Peer Reviewed: No

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  • Instability and temperature-dependence assessment of IGZO TFTs

    Creator:
    Hoshino, Ken
    Abstract:
    Amorphous oxide semiconductors (AOSs) are of great current interest for thin-film transistor (TFT) channel layer applications. In particular, indium gallium zinc oxide (IGZO) is under intense development for commercial applications because of its demonstrated high performance at low processing temperatures. The objective of the research presented in this thesis is...
    Resource Type:
    Masters Thesis