Non-destructive testing is a methodology to inspect production and operational parts for potential flaws, defects, or damages. The present work is based on pulsed wave thermography, a thermal imaging method based on heat conduction to identify surface and subsurface defects potentially present in a component. Pulsed wave thermography applies a...
The development of a continuous and reliable cooling method for computer chips is an evolving subject requiring continuous research in both computer science and thermal management. Two-dye laser induced fluorescence (LIF) provides a minimally invasive way to investigate electronics cooling fluid behavior. Dielectric fluids are of particular interest as they...