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Filtering by: Alternative title ssim Fact sheet 5 Remove constraint Alternative title ssim: Fact sheet 5 Contributor Agirseven, Okan Remove constraint Contributor: Agirseven, Okan License Attribution 4.0 (CC BY 4.0) Remove constraint License: Attribution 4.0 (CC BY 4.0)

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  • Spectroscopic Ellipsometry on Thin Films of TiO2: Comparing Cauchy and Cody-Loretnz Models in CompleteEASE

    Creator:
    Kreb, Joseph
    Abstract:
    Spectroscopic ellipsometry (SE) is used to characterize amorphous and crystalline thin films of TiO2. Amorphous precursor films of TiO2 are deposited by radio frequency magnetron sputtering on fused silica and silicon substrates. Annealing the amorphous precursor films induces them to crystallize into either pure or mixed phases of the three...
    Resource Type:
    Undergraduate Thesis
    Full Text:
    .................................................................................................................................................. 5 Acknowledgements