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Filtering by: Committee Member Burton, R. M. Remove constraint Committee Member: Burton, R. M. Creator Aminzadeh, Payman G. Remove constraint Creator: Aminzadeh, Payman G. Degree Name Master of Science (M.S.) Remove constraint Degree Name: Master of Science (M.S.)

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  • Hot carrier degradation of sub-micron n-channel MOSFETs subject to static stress

    Creator:
    Aminzadeh, Payman G.
    Abstract:
    Hot carrier effects in sub-micron lightly doped drain (LDD) n-channel MOSFETs under static (DC) stress are studied in order to establish the degradation mechanisms of such devices. Degradation is monitored as a function of time at various gate voltages. Under accelerated aging conditions (i.e. large drain voltages) the gate voltage...
    Resource Type:
    Masters Thesis
    Full Text:
    support during the course of this study. I would like to thank Professors S. M. Goodnick, R. Schreier