Search Constraints

Start Over
Filtering by: Subject Electronic circuits -- Noise Remove constraint Subject: Electronic circuits -- Noise Creator Dhamodaran, Sharath Kumar Remove constraint Creator: Dhamodaran, Sharath Kumar Decade 2010-2019 Remove constraint Decade: 2010-2019

Search Results

  • Pattern discovery in noisy images

    Creator:
    Dhamodaran, Sharath Kumar
    Abstract:
    The Focused Ion Beam (FIB) tool is a versatile instrument for nano-machining in circuit editing. Circuit editing is one of the most important steps in the design of an electronic circuit on a chip. Circuit editing can be improved by imaging of silicon plates and analyzing the resultant images. However...
    Resource Type:
    Masters Thesis