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Filtering by: Subject Transistor amplifiers Creator Ge, David Ying Subject Differential amplifiers

1. Reliability and hot-electron effects in analog and mixed-mode circuits

Creator:: Ge, David Ying
Abstract:: Reliability of sub-micron analog circuits is directly related to impact ionization and the subsequent changes in threshold voltage and drain current of n-MOSFET devices. This thesis presents theory of the hot-electron effects on the device characteristics and circuit performance, explores several approaches to improve performance at both the device and...
Resource Type:: Masters Thesis
Full Text:: degradation. By using the composite device in the output gain stage of a CMOS differential amplifier with